International Journal of Applied Science and Technology

ISSN 2221-0997 (Print), 2221-1004 (Online) 10.30845/ijast

Statistical Analysis for Varying-Stress Accelerated Life Testing with Inverse Gaussian Distribution
Naijun Sha, Richard Nii Okine

Abstract
In this article, we consider a time-varying-stress accelerated life testing (ALT) under aWiener decay process. The failure time of products follows a time-transformed inverse Gaussian distribution. We outline some interesting properties of this highly flexible distribution, present the classical maximum likelihood estimation method, and propose a new Bayesian approach for inference. Simulation studies are carried out to assess the performance of the methods under various settings of parameter values and sample sizes. Real data are analyzed for illustrative purposes to demonstrate the efficiency and accuracy of the proposed Bayesian method over the likelihood-based procedure.

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